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Volumn 134, Issue 1, 1998, Pages 113-120

Microstructural characterization of semi-interpenetrating polymer networks by positron lifetime spectroscopy

Author keywords

Density; Dielectric constant; Electrostatic bonding; Free volume; Positron annihilation spectroscopy; Semi interpenetrating polymer networks

Indexed keywords

AEROSPACE APPLICATIONS; ELECTROSTATICS; MICROSTRUCTURE; PERMITTIVITY; PHYSICAL PROPERTIES; POLYIMIDES; SPECTROSCOPY; THERMOPLASTICS; THERMOSETS;

EID: 0031675882     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)80040-2     Document Type: Article
Times cited : (5)

References (11)
  • 1
  • 2
    • 0040764452 scopus 로고    scopus 로고
    • US Patent No. 5171822. Low Toxicity High Temperature PMR Polyimide, 1992
    • R.H. Pater, US Patent No. 5171822. Low Toxicity High Temperature PMR Polyimide, 1992.
    • Pater, R.H.1
  • 11
    • 0003350701 scopus 로고
    • Polymers for microelectronics
    • L.F. Thompson, C.G. Wilson, S. Tagawa (Eds.) Ch. 38. American Chemical Society, Washington, DC
    • A. Eftekhari, A.K. St. Clair, D.M. Stoakley, D.R. Sprinkle, J.J. Singh, Polymers for Microelectronics, in: L.F. Thompson, C.G. Wilson, S. Tagawa (Eds.), ACS Symposium Series No. 537, Ch. 38. American Chemical Society, Washington, DC. 1994, pp. 535-545.
    • (1994) ACS Symposium Series , vol.537 , pp. 535-545
    • Eftekhari, A.1    St. Clair, A.K.2    Stoakley, D.M.3    Sprinkle, D.R.4    Singh, J.J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.