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Volumn , Issue , 1998, Pages 413-420
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New system - reliability assessment methodology
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
PRODUCT DESIGN;
RELIABILITY;
STATISTICAL METHODS;
BAYESIAN TECHNIQUES;
ELECTRONIC EQUIPMENT;
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EID: 0031675598
PISSN: 0149144X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (11)
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References (9)
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