Epitaxial growth of ultrathin Pt films on basal-plane sapphire: The emergence of a continuous atomically flat film

Surface Science

Volumn 396, Issue 1-3, 1998, Pages 16-23

  Hildner, M L ^a,b   Minvielle, T J ^a   Wilson, R J ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b Bldg 142   (United States)

Author keywords

Aluminium oxide; Epitaxy; Growth; Insulating surfaces; Low energy electron diffraction; Metallic films; Platinum; Scanning tunneling microscopy

Indexed keywords

ALUMINUM COMPOUNDS; DEPOSITION; EPITAXIAL GROWTH; ION BEAMS; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; MORPHOLOGY; PLATINUM; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SPUTTERING; TEMPERATURE;

ATOMICALLY FLAT SURFACE; FILM MORPHOLOGY; PLATINUM FILM;

SURFACES;

EID: 0031674425     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00655-9     Document Type: Article

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