메뉴 건너뛰기




Volumn 264-268, Issue PART 2, 1998, Pages 713-716

The characterization of SiC hot-implanted with Ga+

Author keywords

Gallium; Hot Implantation; RBS Channeling; Recrystallization

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL LATTICES; ION IMPLANTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING GALLIUM; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES;

EID: 0031674149     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article
Times cited : (6)

References (12)
  • 5
    • 0003522945 scopus 로고
    • University of South Carolina Press, Columbia
    • O.J. Marsh, "Silicon Carbide 1973", University of South Carolina Press, Columbia, 1974, p.471.
    • (1974) Silicon Carbide 1973 , pp. 471
    • Marsh, O.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.