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Volumn 264-268, Issue PART 2, 1998, Pages 713-716
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The characterization of SiC hot-implanted with Ga+
a a a a a a a |
Author keywords
Gallium; Hot Implantation; RBS Channeling; Recrystallization
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL DEFECTS;
CRYSTAL LATTICES;
ION IMPLANTATION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING GALLIUM;
SEMICONDUCTING SILICON COMPOUNDS;
SUBSTRATES;
HOT IMPLANTATION;
MULTIPLE ENERGY IMPLANTATION TECHNIQUE;
SILICON CARBIDE;
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EID: 0031674149
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: None Document Type: Article |
Times cited : (6)
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References (12)
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