Self-organized one-dimensional Si atomic chains on cubic silicon carbide surface

Materials Science Forum

Volumn 264-268, Issue PART 1, 1998, Pages 387-390

  Semond, F ^a,b,c   Aristov, V Yu ^a,b   Douillard, L ^a,b   Fauchoux, O ^a,b   Soukiassian, P ^a,b   Mayne, A ^b   Dujardin, G ^b  

^a CEA SACLAY   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c CRHEA CNRS   (France)

Author keywords

Atomic Lines; Nanostructures; Scanning Tunneling Microscopy; Surface

Indexed keywords

ANNEALING; CRYSTAL GROWTH; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; STOICHIOMETRY;

ATOMIC LINES;

SILICON WAFERS;

EID: 0031674102     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.264-268.387     Document Type: Article

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