Laser ablation time-of-flight mass spectrometric probing of the surface states of SiO2-based porous materials

Applied Physics A: Materials Science and Processing

Volumn 66, Issue 1, 1998, Pages 99-102

  Xu, C ^a   Long, Y ^a   Zhang, R ^a   Zhao, L ^a   Qian, S ^a   Li, Y ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EXCIMER LASERS; LASER ABLATION; MASS SPECTROMETRY; POROSITY; POROUS MATERIALS; SURFACE PHENOMENA; SURFACE STRUCTURE;

TIME OF FLIGHT MASS SPECTROMETRY (TOF MS);

SILICA;

EID: 0031673857     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050644     Document Type: Article

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