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Volumn 12, Issue 1-2, 1998, Pages 35-47

Fault detection and diagnosis using statistical control charts and artificial neural networks

Author keywords

Artificial neural network; Cumulative summation control chart; Fault detection and diagnosis; Fault signature pattern; Multi layer perceptron; Radial basis function

Indexed keywords

ERROR DETECTION; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; NUCLEAR REACTORS; STATISTICAL PROCESS CONTROL;

EID: 0031673765     PISSN: 09541810     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0954-1810(96)00039-8     Document Type: Article
Times cited : (59)

References (13)
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    • Application of artificial neural networks in process fault diagnosis
    • Sorsa, T. & Koivo, H. N. Application of artificial neural networks in process fault diagnosis. Automatica, 29 (4), 843-849.
    • Automatica , vol.29 , Issue.4 , pp. 843-849
    • Sorsa, T.1    Koivo, H.N.2
  • 5
    • 0040287998 scopus 로고
    • Artificial neural network models of knowledge representation in chemical engineering
    • Hoskins, J. C. & Himmelblau, D. M. Artificial neural network models of knowledge representation in chemical engineering. Comput. Chem. Eng., 1988, 12 (9/10), 881-890.
    • (1988) Comput. Chem. Eng. , vol.12 , Issue.9-10 , pp. 881-890
    • Hoskins, J.C.1    Himmelblau, D.M.2
  • 6
    • 0024764296 scopus 로고
    • Incipient fault diagnosis of chemical processes via artificial neural networks
    • Watanabe, K., Matsuura, I., Abe, M., Kubota, M. & Himmelblau, D. M. Incipient fault diagnosis of chemical processes via artificial neural networks. AlChE Journal, 1989, 35 (11), 1803-1812.
    • (1989) AlChE Journal , vol.35 , Issue.11 , pp. 1803-1812
    • Watanabe, K.1    Matsuura, I.2    Abe, M.3    Kubota, M.4    Himmelblau, D.M.5
  • 7
    • 0024905756 scopus 로고
    • A neural network methodology for process fault diagnosis
    • Venkatasubramanian, V. & Chan, K. A neural network methodology for process fault diagnosis. AlChE Journal, 1989, 35 (12), 1993-2002.
    • (1989) AlChE Journal , vol.35 , Issue.12 , pp. 1993-2002
    • Venkatasubramanian, V.1    Chan, K.2
  • 10
    • 0002916530 scopus 로고
    • Continuous inspection scheme
    • Page, E. S. Continuous inspection scheme. Biometrika, 1954, 41, 100-115.
    • (1954) Biometrika , vol.41 , pp. 100-115
    • Page, E.S.1
  • 11
    • 0016895203 scopus 로고
    • The design and use of V-mask control schemes
    • Lucus, J. M. The design and use of V-mask control schemes. Journal of Quality Technology, 1976, 8 (1), 1-12.
    • (1976) Journal of Quality Technology , vol.8 , Issue.1 , pp. 1-12
    • Lucus, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.