Microstrains in La1.85Sr0.15Cu1-yMyO4 (M = Zn, Ni, Mg) cuprates with y ≤ 0.30

Physica C: Superconductivity and its Applications

Volumn 294, Issue 1-2, 1998, Pages 122-128

  Wu, X S ^a   Jiang, S S ^a   Chen, W M ^a   Lin, Z S ^a   Jin, X ^a   Mao, Z Q ^b   Xu, G J ^b   Zhang, Y H ^b  

^a NANJING UNIVERSITY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Average lattice microstrain; Broadening of reflection; La1.85Sr0.15Cu1 yMy (M = Zn, Ni, Mg) cuprates; Room temperature resistivity; X ray diffraction

Indexed keywords

CERAMIC MATERIALS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; MAGNESIUM; NICKEL; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY DIFFRACTION ANALYSIS; ZINC;

LATTICE MICROSTRAIN; RIETVELD REFINEMENTS;

OXIDE SUPERCONDUCTORS;

EID: 0031673108     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01788-7     Document Type: Article

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