Self-aligning optical particle sizer for the monitoring of particle growth processes in industrial plants

Review of Scientific Instruments

Volumn 69, Issue 6, 1998, Pages 2484-2494

  Bassini, A ^a   Musazzi, S ^a   Paganini, E ^a   Perini, U ^a   Ferri, F ^b  

^a CISE SpA   (Italy)

^b UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MONITORING TECHNIQUE; OPTICAL INSTRUMENT; PARTICLE SIZE;

EID: 0031670429     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148948     Document Type: Article

References (9)

1. P. G. Felton, in 2nd European Symposium on Particle Characterization, edited by K. Leschonski and W. Hufnagel (Nürnberg, Germany, 1979), pp. 662-680.
2. R. Sanier and M. Herman, Appl. Opt. 22, 2294 (1983).
3. A. Bassini, S. Musazzi, E. Paganini, U. Perini, F. Fern, and M. Giglio, Opt. Eng. 31, 1112 (1992).
4. K. S. Shifrin, Physical Optics of Ocean Water (AIP, New York, 1988), Chap. 6, p. 232.
5. Proceedings of the 2nd International Congress on Optical Particle Sizing, edited by E. D. Hirleman (Arizona State University, Tempe, AZ, 1990).
6. Proceedings of the 3rd International Congress on Optical Particle Sizing, edited by M. Maeda, S. Nakae, and M. Ikegami (Yokohama, Japan, 1993).
7. H. C. Van de Hulst, Light Scattering by Small Particles (Dover, New York, 1981), Chap. 12, p. 209.
8. F. Ferri, G. Righini, and E. Paganini, Appl. Opt. 36, 7539 (1997).
9. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1968), Chap. 5, p. 84.