Low-voltage backscattered electron imaging of non-coated biological samples in a low-vacuum environment using a variable-pressure scanning electron microscope with a YAG-detector

Microscopy

Volumn 47, Issue 4, 1998, Pages 351-354

  Ushiki, Tatsuo ^a   Hashizume, Hiroya ^a   Itoh1, Sukehiro ^b   Kuboki1, Kenzo ^b   Saito, Syobu ^b   Tanaka, Keiichi ^c  

^a NIIGATA UNIVERSITY   (Japan)

^b HITACHI LTD   (Japan)

^c SEIREI CHRISTOPHER UNIVERSITY   (Japan)

Author keywords

backscattered electron (BSE) imaging; biology; low voltage; low vacuum; variable pressure scanning electron microscope; Yttrium Aluminum Garnet (YAG) detector

Indexed keywords

ALUMINUM COATINGS; BACKSCATTERING; ELECTRON SCATTERING; ELECTRONS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SURFACE MORPHOLOGY; YTTRIUM;

ACCELERATING VOLTAGES; BACKSCATTERED ELECTRON IMAGING; BACKSCATTERED ELECTRONS; BIOLOGICAL SAMPLES; LOW VACUUM; LOW VACUUM ENVIRONMENT; LOW VOLTAGES; VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE; YTTRIUM ALUMINUM GARNET; YTTRIUM ALUMINUM GARNET DETECTOR;

YTTRIUM ALUMINUM GARNET;

ANIMALIA; GLOMERULUS;

EID: 0031663743     PISSN: 20505698     EISSN: 20505701     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023602     Document Type: Article

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