New features of exchange coupling in FM/AF bilayers

Journal of Magnetism and Magnetic Materials

Volumn 177-181, Issue PART 2, 1998, Pages 1235-1236

  Ambrose, T ^a   Sommer, R L ^b   Chien, C L ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

^b FEDERAL UNIVERSITY OF SANTA MARIA   (Brazil)

Author keywords

Anisotropy induced; Coercivity angular dependence; Exchange coupling thin films; Exchange field

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; COERCIVE FORCE; FERROMAGNETIC MATERIALS; FREE ENERGY; HYSTERESIS; ION EXCHANGE; MAGNETIC ANISOTROPY; MAGNETIC FIELD EFFECTS; MAGNETIC VARIABLES MEASUREMENT; MAGNETRON SPUTTERING; TEMPERATURE; THIN FILMS;

COERCIVITY ANGULAR DEPENDENCE; EXCHANGE COUPLING; EXCHANGE FIELD; NEEL TEMPERATURE;

MULTILAYERS;

EID: 0031656396     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(97)00369-7     Document Type: Article

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