Electron spectroscopy for the determination of concentration depth profiles and for the investigation of local electric fields

Surface Investigation X-Ray, Synchrotron and Neutron Techniques

Volumn 13, Issue 4-5, 1998, Pages 463-474

  Morgner, H ^a  

^a UNIVERSITY OF WITTEN HERDECKE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; HELIUM; MOLECULES; SURFACE PHENOMENA;

METASTABLE HELIUM ATOMS; METASTABLE INDUCED ELECTRON SPECTROSCOPY (MIES);

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031654409     PISSN: 10274510     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)