Test circuits for characterizing power transistors in ZVS and ZCS circuits

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1998, Pages 515-518

  Trivedi, M ^a   Evazians, R ^a   Shenai, K ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK SYNTHESIS; ELECTRIC NETWORK TOPOLOGY; SEMICONDUCTOR DEVICE TESTING; SWITCHING NETWORKS; TRANSISTORS;

ZERO CURRENT SWITCHING (ZCS); ZERO VOLTAGE SWITCHING (ZVS);

POWER ELECTRONICS;

EID: 0031654366     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)