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Volumn 13, Issue 4-5, 1998, Pages 499-514

XPS investigation of surface phenomena in sulphide flotation

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; OXIDATION; PYRITES; SURFACE ROUGHNESS; SURFACE TREATMENT; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031653824     PISSN: 10274510     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (40)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.