Study of ESD-induced latent damage in CMOS integrated circuits

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1998, Pages 279-283

  Huh, Yoonjong ^a   Lee, Myoung G ^a   Lee, Jaesik ^a   Jung, Hyuk C ^a   Li, Tong ^a   Song, Du H ^a   Lee, Young J ^a   Hwang, Jeong M ^a   Sung, Yung K ^a   Kang, S M ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRONICS PACKAGING; ELECTROSTATICS; MOSFET DEVICES; RANDOM ACCESS STORAGE;

DYNAMIC RANDOM ACCESS MEMORY (DRAM); ELECTROSTATIC DISCHARGES (ESD);

CMOS INTEGRATED CIRCUITS;

EID: 0031653444     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)