Using OIM to interpret the dynamically recrystallized texture of a low stacking fault energy FCC material

Materials Science Forum

Volumn 273-275, Issue , 1998, Pages 249-254

  Bocher, Ph ^a   Azar, J ^a   Adams, B L ^b   Jonas, J J ^a  

^a MCGILL UNIVERSITY   (Canada)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Deformation Texture; Dynamic Recrystallization; Hot Deformation; Local Texture; Low Stacking Fault Energy; Work Hardening

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEFORMATION; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; RECRYSTALLIZATION (METALLURGY); STACKING FAULTS; STAINLESS STEEL; STRAIN HARDENING; TEXTURES;

DYNAMIC RECRYSTALLIZATION; LOW STACKING FAULT ENERGY; ORIENTATION IMAGING MICROSCOPY (OIM);

POLYCRYSTALLINE MATERIALS;

EID: 0031653427     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.273-275.249     Document Type: Article

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