Novel, high resolution, non-contact channel temperature measurement technique

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1998, Pages 108-112

  Kim, Q ^a   Stark, B ^a   Kayali, S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; GATES (TRANSISTOR); INFRARED SPECTROSCOPY; MESFET DEVICES; SEMICONDUCTING GALLIUM ARSENIDE;

IN SITU OPTICAL TECHNIQUES; INFRARED EMISSION SPECTROSCOPY; NON CONTACT MEASUREMENT;

TEMPERATURE MEASUREMENT;

EID: 0031653004     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)