Noise sensitivity of the ADC histogram test

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1998, Pages 88-91

  Carbone, Paolo ^a   Petri, Dario ^a  

^a UNIVERSITY OF PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; ELECTRONIC EQUIPMENT TESTING; SPURIOUS SIGNAL NOISE;

ANALOG TO DIGITAL CONVERSION (ADC) HISTOGRAM TESTS;

ANALOG TO DIGITAL CONVERSION;

EID: 0031652780     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)