300 °C Dynamic-feedback instrumentation amplifier

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 1998, Pages 322-323

  de Jong, P ^a   Meijer, G ^a   van Roermund, A ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SWITCHES; GAIN MEASUREMENT; RESISTORS;

DYNAMIC FEEDBACK INSTRUMENTATION AMPLIFIERS; FOUR WIRE MEASUREMENT TECHNIQUE;

FEEDBACK AMPLIFIERS;

EID: 0031652008     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)