Space charge analysis in doped zinc phthalocyanine thin films

Optical Materials

Volumn 9, Issue 1-4, 1998, Pages 240-244

  Remaki, Boudjemaa ^a   Guillaud, Gerard ^a   Mayes, Denise ^b  

^a UNIVERSITÉ LYON 1   (France)

^b UNIVERSITY OF EAST ANGLIA   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRIC SPACE CHARGE; GOLD; OHMIC CONTACTS; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS; SUBSTRATES; THIN FILMS;

CAPACITANCE VOLTAGE CHARACTERISTICS; CARRIER TRAPPING; RECTIFYING EFFECT; SCHOTTKY BARRIER; SPACE CHARGE ANALYSIS; ZINC PHTHALOCYANINE;

OPTICAL FILMS;

EID: 0031651710     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(97)00134-1     Document Type: Article

References (11)

1. A.K. Ghosh, D.L. Morel, T. Feng, R.F. Shaw, C.A. Rowe Jr., J. Appl. Phys. 45 (1) (1974) 230.
2. M. Martin, J.J. Andre, J. Simon, Nouv. J. Chim. 5 (10) (1981) 485.
3. G.D. Sharma, Synth. Metals 74 (1995) 227.
4. A. Twarowski, J. Chem. Phys. 77 (11) (1982) 5840.
5. B. Boudjema, G. Guillaud, M. Gamoudi, M. Maitrot, J.J. Andre, M. Martin, J. Simon, J. Appl. Phys. 56 (8) (1984) 2323.
6. M. Maitrot, G. Guillaud, B. Boudjema, J.J. Andre, J. Simon, Appl. Phys. 60 (7) (1986) 2396.
7. C.J. Liu, J.C. Hsieh, Y.H. Ju, J. Vac. Sci. Technol. A 14 (3) (1996) 753.
8. W.J. Pietro, Adv. Mater. 6 (3) (1994) 239.
9. A.J. Tworowski, A.C. Albrecht, J. Chem. Phys. 72 (3) (1980) 5840.
10. B. Remaki, D. Jullien, C. Jouve, Sensors Actuators A 33 (1992) 85.
11. B. Balland, B. Remaki, J.J. Marchand, J. Phys. E 21 (1988) 559.