Multiwinding transformers: A successive refinement method to characterize a general equivalent circuit

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1998, Pages 717-722

  Schellmanns, A ^a   Berrouche, K ^a   Keradec, J P ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE MEASUREMENT; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS;

MULTIWINDING TRANSFORMERS;

ELECTRIC TRANSFORMERS;

EID: 0031650554     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)