TLM extension for the study of screen printing contacts on multicrystalline silicon

EPJ Applied Physics

Volumn 2, Issue 1, 1998, Pages 87-92

  El Omari, H ^a   Boyeaux, J P ^a   Laugier, A ^a  

^a UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; SCREEN PRINTING; SEMICONDUCTING SILICON; SEMICONDUCTOR METAL BOUNDARIES; TRANSMISSION LINE THEORY;

SCREEN PRINTING CONTACTS; TRANSMISSION LINE MODEL (TLM) METHOD;

SILICON SOLAR CELLS;

EID: 0031650094     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:1998160     Document Type: Article

References (10)

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