Structural defects in crystals and techniques for their detection

Materials Science Forum

Volumn 276-277, Issue , 1998, Pages 291-306

  Klapper, H ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

Crystal Defects; Dislocations; Etching; Glide Dislocations; Growth Sectors; Growth Striations; Growth Sector Boundaries; Inclusions; Laue Method; Misfit Dislocations; Stress Birefringence; Vicinal Pyramids; Vicinal Sectors; X Ray Topography

Indexed keywords

BIREFRINGENCE; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); ETCHING; INCLUSIONS; X RAY CRYSTALLOGRAPHY;

LAUE METHOD; VICINAL PYRAMIDS; VICINAL SECTORS; X RAY TOPOGRAPHY;

CRYSTAL GROWTH;

EID: 0031648683     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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