Structural characterization of submonolayer C/A1(111)

Surface Science

Volumn 395, Issue 1, 1998, Pages 120-129

  Scalese, S ^a,b   Agostino, R G ^a   Hayoz, J ^a   Naumovic D ^a   Fasel, R ^a   Aebi, P ^a   Schlapbach, L ^a  

^a UNIVERSITY OF FRIBOURG   (Switzerland)

^b UNIVERSITY OF CALABRIA   (Italy)

Author keywords

Aluminum; Carbon; Diamond; Diffusion and migration; Low index single crystal surfaces; Photoelectron diffraction; Surface structure

Indexed keywords

ALUMINUM; ANNEALING; DIAMONDS; DIFFUSION IN SOLIDS; ELECTRON DIFFRACTION; MONOLAYERS; ORDER DISORDER TRANSITIONS; SINGLE CRYSTALS; SURFACE STRUCTURE;

LOW INDEX SINGLE CRYSTALS; PHOTOELECTRON DIFFRACTION;

ADSORPTION;

EID: 0031648116     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00621-3     Document Type: Article

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