Characterizing reliability in a product/process design-assurance program

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1998, Pages 105-112

  Kerscher III, William J ^a   Booker, Jane M ^a   Bement, Thomas R ^a   Meyer, Mary A ^a  

^a DELPHI CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; MATHEMATICAL MODELS; PROCESS ENGINEERING; PRODUCT DESIGN; QUALITY ASSURANCE; RELIABILITY;

BAYES ANALYSIS; RELIABILITY GROWTH MODEL; VALIDATION PLANNING;

PRODUCTION ENGINEERING;

EID: 0031647545     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)