Effect of the new ASTM E 722-93 (Si) Kerma displacement data on reactor neutron dosimetry

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 402, Issue 1, 1998, Pages 143-146

  Morin, J ^a   Arnoud, J C ^a   David, J ^a   Zyromski, P ^a  

^a CENTRE DE VALDUC   (France)

Author keywords

(Si) displacement Kerma; Activation detectors; Hardening; Neutron spectrum; Pin (Si) diodes; Reactors

Indexed keywords

NEUTRON IRRADIATION; NUCLEAR REACTORS; RADIATION HARDENING; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES;

ACTIVATION DETECTORS; EQUIVALENT NEUTRON FLUENCE; NEUTRON SPECTRUM; SILICON DISPLACEMENT KERMA;

DOSIMETRY;

EID: 0031647289     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)01025-5     Document Type: Article

References (8)

1. J. Dorlet, Application des méthodes de la programmation linéaire au dépouillement des résultats de mesures par activation, IAEA Technical Committee Meeting on Current Status of Neutron Spectrum Unfolding, 10-12 October 1977, Oak Ridge, TN.
2. G. Ledanois (CEA/Limeil), Solution d'un problème de dosimétrie par la méthode des corrélations bayesiennes, communication privée.
3. M.A. Oliver, IEEE Trans. Nucl. Sci. NS-41 (6) (1994) 2132.
4. J. Morin, J.C. Arnoud, J. David, P. Zyromski, Measuring 1 MeV (Si) equivalent neutron fluences with PIN silicon diodes, RADECS 93, 2nd European Conf. on Radiation Effects on Components and Systems, 1993.
5. J.C. Kelly, P.J. Griffin, Comparison of measured silicon displacement damage ratios with ASTM E-722 and NJOY calculated damage, 7th ASTM EURATOM Symp. on Reactor Dosimetry, 1990, pp. 711-717.
6. J. Morin, J.C. Arnoud, J. David, P. Zyromski, Range enlargement in measuring 1 MeV (Si) neutron fluences with PIN silicon diodes, RADECS 95, 3rd European Symp. on Radiations Effects on Components and Systems.
7. C.R. Heimbach, Intercomparison of neutron test facilities for equivalent damage to electronics, Reactor dosimetry ASTM STP 1228, 1994, pp. 509-514.
8. J.G. Williams, IEEE Trans. Nucl. Sci. NS-41 (6) (1994) 2147.