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Volumn 56, Issue 1, 1998, Pages 53-58

Eddy current sensors for measuring fiber coating thickness

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CERAMIC FIBERS; ELECTRIC IMPEDANCE MEASUREMENT; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTROMAGNETIC WAVE SCATTERING; INTERFACES (MATERIALS); INTERFEROMETERS; OPTIMIZATION; PROBES; RESONANCE; SENSORS; SUBSTRATES;

EID: 0031646854     PISSN: 00255327     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review
Times cited : (1)

References (9)
  • 1
    • 11644297672 scopus 로고
    • A Method of Monitoring Thin Current Conducting Coatings and Films
    • Garvrilin, V.V., and Y.K. Grigulis, "A Method of Monitoring Thin Current Conducting Coatings and Films," Defektoskopiya, Vol. 16, No. 12, 1980, pp 20-27.
    • (1980) Defektoskopiya , vol.16 , Issue.12 , pp. 20-27
    • Garvrilin, V.V.1    Grigulis, Y.K.2
  • 2
    • 11644288069 scopus 로고
    • The Latest Techniques and Instruments for Measuring the Thickness of Metallic Coatings (Part 12)
    • Sep.
    • Guehring, W.H., "The Latest Techniques and Instruments for Measuring the Thickness of Metallic Coatings (Part 12)," British Journal of NDT, Sep. 1982, p 251.
    • (1982) British Journal of NDT , pp. 251
    • Guehring, W.H.1
  • 3
    • 0020704201 scopus 로고
    • Eddy Current Impedence Plane Analysis
    • Feb.
    • Hagemaier, D.J., "Eddy Current Impedence Plane Analysis," Materials Evaluation, Vol. 41, No. 2, Feb. 1983, p 211.
    • (1983) Materials Evaluation , vol.41 , Issue.2 , pp. 211
    • Hagemaier, D.J.1
  • 4
    • 0026914474 scopus 로고
    • Development of In-Line Coating Thickness Monitor for Hermetic Carbon Coated Fiber
    • 7th Symposium on Optical Fiber Measurements, Boulder, CO, Sep.
    • Ishida, Y., Y. Kohmura, and S.Arai, "Development of In-Line Coating Thickness Monitor for Hermetic Carbon Coated Fiber," NIST Special Publication No. 839, 7th Symposium on Optical Fiber Measurements, Boulder, CO, Sep. 1992, pp 67-70.
    • (1992) NIST Special Publication No. 839 , pp. 67-70
    • Ishida, Y.1    Kohmura, Y.2    Arai, S.3
  • 5
    • 0024702533 scopus 로고
    • A Guide to the Different Methods of Coating Thickness Measurement
    • Jul.
    • Latter, T., "A Guide to the Different Methods of Coating Thickness Measurement," British Journal of NDT, Vol. 31, No. 7, Jul. 1989, p 372.
    • (1989) British Journal of NDT , vol.31 , Issue.7 , pp. 372
    • Latter, T.1
  • 6
    • 0000892102 scopus 로고
    • Thickness and Conductivity of Metallic Layers from Eddy Current Measurements
    • Apr.
    • Moulder, J., E. Uzal, and J.H. Rose,"Thickness and Conductivity of Metallic Layers from Eddy Current Measurements," Review of Scientific Instruments, Vol. 63, No. 4, Apr. 1992, p 1.
    • (1992) Review of Scientific Instruments , vol.63 , Issue.4 , pp. 1
    • Moulder, J.1    Uzal, E.2    Rose, J.H.3
  • 7
    • 11644313661 scopus 로고
    • Reconstructing Electrical Conductivity Profiles from Variable-Frequency Eddy Current Measurements
    • Norton, S.J., A.H. Kahn, and M.L. Mester, "Reconstructing Electrical Conductivity Profiles from Variable-Frequency Eddy Current Measurements," Research in Nondestructive Evaluatio, Vol. 1, No. 167, 1989.
    • (1989) Research in Nondestructive Evaluatio , vol.1 , Issue.167
    • Norton, S.J.1    Kahn, A.H.2    Mester, M.L.3
  • 8
    • 0024909790 scopus 로고
    • Thickness Touchless Measurements Using Eddy Current Sensors
    • Placko, D., C. Sol, and D. Jacob, "Thickness Touchless Measurements Using Eddy Current Sensors," Electric Machines and Power Systems, Vol. 17, 1989, pp 125-137.
    • (1989) Electric Machines and Power Systems , vol.17 , pp. 125-137
    • Placko, D.1    Sol, C.2    Jacob, D.3
  • 9
    • 11644258506 scopus 로고    scopus 로고
    • US Patent No. 5,033,304, "Method and Apparatus for Laser Ultrasonic Characterization of Coated Fibers," Jul. 23, 1991
    • Rosen, M., US Patent No. 5,033,304, "Method and Apparatus for Laser Ultrasonic Characterization of Coated Fibers," Jul. 23, 1991.
    • Rosen, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.