Scanning tunneling microscopy of chemically cleaned germanium (100) surfaces

Surface Science

Volumn 395, Issue 1, 1998, Pages 69-74

  Gan, S ^a   Li, L ^a   Nguyen, T ^a   Qi, H ^a   Hicks, R F ^a   Yang, M ^b  

^a University of California   (United States)

^b TECSTAR lNC   (United States)

Author keywords

Germanium; Scanning tunneling microscopy; Step bunching

Indexed keywords

ANNEALING; CARBON; EMISSION SPECTROSCOPY; ETCHING; HYDROGEN PEROXIDE; OXIDATION; OZONE; SCANNING TUNNELING MICROSCOPY; SURFACE CLEANING; SURFACE STRUCTURE; ULTRAVIOLET RADIATION;

STEP BUNCHING;

SEMICONDUCTING GERMANIUM;

EID: 0031646808     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00608-0     Document Type: Article

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