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Volumn 10, Issue 1, 1998, Pages 111-113

Analysis of optical waveguides with high-reflection coatings using the FD-TD method

Author keywords

Finite difference method; High reflection coating

Indexed keywords

FINITE DIFFERENCE METHOD; LIGHT REFLECTION; LIGHT TRANSMISSION; MATRIX ALGEBRA; REFLECTIVE COATINGS; TIME DOMAIN ANALYSIS;

EID: 0031646631     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.651127     Document Type: Article
Times cited : (23)

References (12)
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    • Yee, K.S.1
  • 6
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    • Simulation and analysis of waveguide based optical integrated circuits
    • S. T. Chu, W. P. Huang, and S. K. Chaudhuri, "Simulation and analysis of waveguide based optical integrated circuits," Comp. Phys. Commun., vol. 68, pp. 451-484, 1991.
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  • 8
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    • Subpicosecond electrodynamics of distributed Bragg reflector microlasers: Results from finite-difference time-domain simulations
    • S. C. Hagness, R. M. Joseph, and A. Taflove, "Subpicosecond electrodynamics of distributed Bragg reflector microlasers: Results from finite-difference time-domain simulations," Radio Sci., vol. 31, pp. 931-941, 1996.
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    • Hagness, S.C.1    Joseph, R.M.2    Taflove, A.3
  • 9
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    • A perfectly matched layer for the absorption of electromagnetic waves
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  • 10
    • 0028517547 scopus 로고
    • Ultrawideband absorbing boundary condition for termination of waveguiding structures in FDTD simulations
    • C. E. Reuter, R. M. Joseph, E. T. Thiele, D. S. Katz, and A. Taflove, "Ultrawideband absorbing boundary condition for termination of waveguiding structures in FDTD simulations," IEEE Microwave Guided Wave Lett., vol. 4, pp. 344-346, 1994.
    • (1994) IEEE Microwave Guided Wave Lett. , vol.4 , pp. 344-346
    • Reuter, C.E.1    Joseph, R.M.2    Thiele, E.T.3    Katz, D.S.4    Taflove, A.5
  • 11
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    • Analysis of antireflection coatings using the FD-TD method with the PML absorbing boundary condition
    • J. Yamauchi, M. Mita, S. Aoki, and H. Nakano, "Analysis of antireflection coatings using the FD-TD method with the PML absorbing boundary condition," IEEE Photon. Technol. Lett., vol. 8, pp. 239-241, 1996.
    • (1996) IEEE Photon. Technol. Lett. , vol.8 , pp. 239-241
    • Yamauchi, J.1    Mita, M.2    Aoki, S.3    Nakano, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.