Atom probe and field ion microscope investigation of the negative creep mechanism in nickel-base superalloy

Journal of Materials Processing Technology

Volumn 73, Issue 1-3, 1998, Pages 74-77

  Ren, D G ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

Atom probe field ion microscope; Negative creep mechanism; Nickel base superalloy

Indexed keywords

CREEP TESTING; LATTICE CONSTANTS; MICROSCOPIC EXAMINATION; SUPERALLOYS; SURFACE STRUCTURE;

ATOM PROBE FIELD ION MICROSCOPE; NEGATIVE CREEP MECHANISM;

NICKEL ALLOYS;

EID: 0031646595     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(97)00214-8     Document Type: Article

References (7)

1. B. Reppich, Z. Metallkd. 85 (1) (1994) 28-38.
2. M. Heilmater, B. Reppich, Creep Fracture Eng. Mater. Structure (1993) 28.
3. R.W. Fountain, M. Korchymky, Trans. Am. Soc. Met. 1 (51) (1959) 108.
4. E. Metcalf, B. Nath, Mater. Sci. Eng. 67 (1984) 157-162.
5. D.G. Ren, J. Phys. C6 (1987) 453.
6. Zhang Yu, Procedings 1st Chinese Youth on Materials Science, Shenyang, 1987, pp. 303.
7. W.B. Pearson, A Handbook of Lattice Spacings and Structure of Metal and Alloys, Pergamon, Oxford, 1958.