Thickness dependence of polarization and response characteristics in thin FLC films

Ferroelectrics

Volumn 212, Issue 1-4, 1998, Pages 29-36

  Pikin, S ^a   Osipov, M ^a   Biradar, A ^a   Beresnev, L ^a   Haase, W ^a  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; DIELECTRIC RELAXATION; ELECTRIC FILTERS; FREE ENERGY; LIQUID CRYSTALS; MATHEMATICAL MODELS; PERMITTIVITY; POLARIZATION; SURFACE TENSION; THERMAL EFFECTS; THIN FILMS;

FERROELECTRIC LIQUID CRYSTALS;

FERROELECTRIC MATERIALS;

EID: 0031645907     PISSN: 00150193     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/00150199808217348     Document Type: Article

References (8)