Evaluation of indium diffused M-i-n CdZnTe detectors

Materials Research Society Symposium - Proceedings

Volumn 487, Issue , 1998, Pages 165-170

  Gagliardi, M A ^a   Nenonen, S ^a   Gagliardi, T ^a   Aleksejeva, L ^a   Ivanov, V ^a   Bavdaz, M ^a  

^a Oxford Instruments Analytical Oy   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM ZINC TELLURIDE; ELECTROLESS CONTACT;

COOLING; CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION IN SOLIDS; ELECTRIC CONTACTS; GOLD; HETEROJUNCTIONS; LEAKAGE CURRENTS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING INDIUM; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES;

RADIATION DETECTORS;

EID: 0031645342     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)