Highly reliable 1T/1C ferroelectric memory

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1998, Pages 122-123

  Jung, Dong Jin ^a   Lee, Sung Yung ^a   Koo, Bon Jae ^a   Hwang, Yoo Sang ^a   Shin, Dong Won ^a   Lee, Jin Woo ^a   Chun, Yoon Soo ^a   Shin, Soo Ho ^a   Lee, Mi Hyang ^a   Park, Hong Bae ^a   Lee, Sang In ^a   Kim, Kinam ^a   Lee, Jong Gil ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CMOS INTEGRATED CIRCUITS; ELECTRODES; FERROELECTRIC DEVICES; POLARIZATION; THIN FILMS;

FERROELECTRIC MEMORY;

RANDOM ACCESS STORAGE;

EID: 0031645242     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)