Thermal fluctuation of the order parameter symmetry in high Tc superconductors revealed from the penetration depth measurement

Solid State Communications

Volumn 105, Issue 3, 1998, Pages 155-159

  Chen, Li Jui ^a   Lue, Juh Tzeng ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

A. high Tc superconducting films; C. order parameter; E. microwave penetration method

Indexed keywords

MICROWAVE DEVICES; SUPERCONDUCTING FILMS; THALLIUM COMPOUNDS; YTTRIUM BARIUM COPPER OXIDES;

D WAVE; DIELECTRIC MICROWAVE RESONATOR; MICROWAVE PENETRATION METHOD; ORDER PARAMETER; S WAVE; TEMPERATURE DEPENDENCE; THALLIUM BARIUM CALCIUM CUPRATE; THERMAL FLUCTUATION;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0031644847     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(97)10098-9     Document Type: Article

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