Near-field time-resolved imaging with far-infrared dipole sources

Conference on Lasers and Electro-Optics Europe - Technical Digest

Volumn , Issue , 1998, Pages 64-65

  Hunsche, S ^a   Cai, Y ^a   Brener, I ^a   Nuss, M C ^a   Wynn, J ^a   Lopata, J ^a   Pfeiffer, L ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION IMPLANTATION; LASER BEAMS; LIGHT EMISSION; LIGHT REFLECTION; SCANNING; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES;

NEAR FIELD MICROSCOPY; NEAR FIELD TIME RESOLVED IMAGING;

IMAGING TECHNIQUES;

EID: 0031644798     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cleo.1998.675871     Document Type: Conference Paper

References (6)