메뉴 건너뛰기





Volumn 214, Issue 1 -2 pt 3, 1998, Pages 35-42

Evolution of irreversible layer deformations in FLC devices caused by high electric field treatment

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DEFORMATION; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; LIQUID CRYSTALS; X RAY CRYSTALLOGRAPHY;

EID: 0031644102     PISSN: 00150193     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/00150199808012936     Document Type: Article
Times cited : (11)

References (21)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.