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Volumn 214, Issue 1 -2 pt 3, 1998, Pages 35-42
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Evolution of irreversible layer deformations in FLC devices caused by high electric field treatment
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL STRUCTURE;
DEFORMATION;
ELECTRIC FIELD EFFECTS;
ELECTRIC POTENTIAL;
LIQUID CRYSTALS;
X RAY CRYSTALLOGRAPHY;
CHEVRON STRUCTURE;
FERROELECTRIC LIQUID CRYSTALS;
FERROELECTRIC DEVICES;
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EID: 0031644102
PISSN: 00150193
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1080/00150199808012936 Document Type: Article |
Times cited : (11)
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References (21)
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