Performance criteria for evaluating the importance of on-chip inductance

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 1998, Pages 244-247

  Ismail, Yehea I ^a   Friedman, Eby G ^a   Neves, Jose L ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS;

FIGURE OF MERIT (FOM); INDUCTANCE EFFECTS;

TRANSMISSION LINE THEORY;

EID: 0031643950     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)