|
Volumn Part F133492, Issue , 1998, Pages 87-91
|
Solder joint reliability of a lead-less RF-transistor
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALUMINUM NITRIDE;
ELECTRONICS PACKAGING;
FORECASTING;
NETWORK COMPONENTS;
RELIABILITY;
COMPUTER SIMULATION;
CRACK PROPAGATION;
CREEP;
FINITE ELEMENT METHOD;
HEAT CONDUCTION;
HEAT LOSSES;
MATHEMATICAL MODELS;
PRINTED CIRCUIT BOARDS;
SOLDERED JOINTS;
STRESS ANALYSIS;
THERMAL CYCLING;
TRANSISTORS;
ACCELERATED TEMPERATURE CYCLING;
ACCELERATION FACTORS;
BOARD-LEVEL RELIABILITY;
FIELD CONDITIONS;
PACKAGE MATERIALS;
SOLDER JOINT RELIABILITY;
THEORETICAL METHODS;
THERMAL CONDUCTION;
SOLDERED JOINTS;
ELECTRONICS PACKAGING;
LEAD LESS RADIO FREQUENCY (RF) TRANSISTORS;
THERMOMECHANICAL RELIABILITY;
|
EID: 0031643128
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ECTC.1998.678675 Document Type: Conference Paper |
Times cited : (9)
|
References (2)
|