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Volumn Part F133492, Issue , 1998, Pages 87-91

Solder joint reliability of a lead-less RF-transistor

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM NITRIDE; ELECTRONICS PACKAGING; FORECASTING; NETWORK COMPONENTS; RELIABILITY; COMPUTER SIMULATION; CRACK PROPAGATION; CREEP; FINITE ELEMENT METHOD; HEAT CONDUCTION; HEAT LOSSES; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS; SOLDERED JOINTS; STRESS ANALYSIS; THERMAL CYCLING; TRANSISTORS;

EID: 0031643128     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.1998.678675     Document Type: Conference Paper
Times cited : (9)

References (2)
  • 2
    • 0001784769 scopus 로고
    • Reliability of plastic ball grid array assembly
    • J. Lau, Editor, McGraw-Hill Inc., New York
    • R. Darveaux, K. Banerji, A. Mawer, G. Dody, "Reliability of Plastic Ball Grid Array Assembly, " Ball Grid Array Technology, J. Lau, Editor, McGraw-Hill Inc., New York, 1995
    • (1995) Ball Grid Array Technology
    • Darveaux, R.1    Banerji, K.2    Mawer, A.3    Dody, G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.