Microbeam mapping of single event latchups and single event upsets in CMOS SRAMs

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 520-527

  Barak, J ^a   Adler, E ^a   Fischer, B E ^a   Schlogl, M ^a   Metzger, S ^a  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; ELECTRIC CONDUCTIVITY; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRIC SURGES; ION BEAMS; MOSFET DEVICES; RANDOM ACCESS STORAGE; THREE DIMENSIONAL;

MICROBEAM MAPPING; SINGLE EVENT LATCHUPS; SINGLE EVENT UPSETS; STATIC RANDOM ACCESS STORAGE;

RADIATION EFFECTS;

EID: 0031643030     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)