Dielectric characterization of a material without layer shrinkage

Ferroelectrics

Volumn 212, Issue 1-4, 1998, Pages 67-78

  Buivydas, M ^a   Lagerwall, S T ^a   Dierking, I ^a   Gouda, F ^a   Mochizuki, A ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES OF LIQUIDS; ELECTROOPTICAL DEVICES; MOLECULAR STRUCTURE; NAPHTHALENE; PHASE TRANSITIONS; SHRINKAGE; SMECTIC LIQUID CRYSTALS; SPECTROSCOPIC ANALYSIS;

DIELECTRIC SPECTROSCOPY; FERROELECTRIC LIQUID CRYSTALS;

FERROELECTRIC MATERIALS;

EID: 0031642348     PISSN: 00150193     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/00150199808217352     Document Type: Article

References (9)