Strategies of MilliRad sensitivity in PMOS dosimeters

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 288-293

  Conneely, C ^a   O'Connell, B ^a   Hurley, P ^a   Lane, W ^a   Adams, L ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); MOS DEVICES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

DYNAMIC SIGNAL ANALYZER; NANOVOLT PREAMPLIFIER;

DOSIMETERS;

EID: 0031642345     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)