Growth and structure of nanometric iron oxide films

Materials Research Society Symposium - Proceedings

Volumn 524, Issue , 1998, Pages 101-107

  Guiot, E ^a   Gota, S ^a   Henriot, M ^a   Gautier Soyer, M ^a   Lefebvre, S ^a  

^a CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SYNCHROTRON RADIATION; SYNTHESIS (CHEMICAL); X RAY CRYSTALLOGRAPHY;

GRAZING INCIDENCE X RAY DIFFRACTION (GIXRD) ANALYSIS;

IRON OXIDES;

EID: 0031642149     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-524-101     Document Type: Conference Paper

References (11)