Chemical etching and post-annealing for high performance CdZnTe strip detectors

Materials Research Society Symposium - Proceedings

Volumn 487, Issue , 1998, Pages 159-164

  Shi, Z Q ^a   Stahle, C M ^a   Shu, P ^a  

^a HUGHES STX CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ANNEALING; BROMINE; ELECTRIC RESISTANCE; ETCHING; GLYCOLS; LEAKAGE CURRENTS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SURFACE PROPERTIES;

CADMIUM ZINC TELLURIDE; ETHYLENE GLYCOL;

RADIATION DETECTORS;

EID: 0031642007     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)