Characterization of W-band MMIC power amplifier using on-wafer pulsed power test

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1998, Pages 1483-1486

  Yang, D C ^a   Yang, J M ^a   Wang, H ^a   Huang, P ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; MICROWAVE AMPLIFIERS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

ON-WAFER PULSED POWER TEST; POWER ADDED EFFICIENCY;

POWER AMPLIFIERS;

EID: 0031641916     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)