Identification of flaws using eddy current testing

COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

Volumn 17, Issue 4, 1998, Pages 516-527

  Sikora, R ^a   Chady, T ^a   Gratkowski, S ^a   Komorowski, M ^a  

^a WEST POMERANIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; ANNEALING; CRACKS; ELECTRIC EXCITATION; ELECTRIC INDUCTORS; ELECTROMAGNETISM; MAGNETIC FLUX; NEURAL NETWORKS; PROBLEM SOLVING; DEFECTS; ELECTRIC IMPEDANCE; FUNCTIONS; INVERSE PROBLEMS;

EDDY CURRENT FLOW; NEURAL MODELS; SURFACE CRACKS; FLAW DETECTION;

EDDY CURRENT TESTING;

EID: 0031640803     PISSN: 03321649     EISSN: None     Source Type: Journal    
DOI: 10.1108/03321649810210802     Document Type: Article

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