Characterization of power electronics system interconnect parasitics using time domain reflectometry

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 2, Issue , 1998, Pages 1937-1943

  Zhu, Huibin ^a   Hefner Jr , Allen R ^a   Lai, Jih Sheng ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC INTERFERENCE (EMI); INTERCONNECT PARASITICS; TIME DOMAIN REFLECTOMETRY (TDR);

BIPOLAR TRANSISTORS; BUSBARS; CAPACITORS; ELECTRIC FILTERS; ELECTRIC NETWORK PARAMETERS; EQUIVALENT CIRCUITS; POWER CONVERTERS; REFLECTOMETERS; SIGNAL INTERFERENCE; SWITCHING CIRCUITS; TIME DOMAIN ANALYSIS; TRANSMISSION LINE THEORY;

POWER ELECTRONICS;

EID: 0031638468     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESC.1998.703445     Document Type: Conference Paper

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