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Volumn 36, Issue 4, 1998, Pages 707-719

A capacitance tomographic system for the measurement of void fraction in transient cavitation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0031638319     PISSN: 00221686     EISSN: None     Source Type: Journal    
DOI: 10.1080/00221689809498617     Document Type: Article
Times cited : (8)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.