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Volumn 505, Issue , 1998, Pages 71-76
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New technique for visualizing the displacement field of indentations: The case of a soft film on a hard substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM ALLOYS;
DEFORMATION;
ION BEAM LITHOGRAPHY;
MULTILAYERS;
PLASTIC FLOW;
SUBSTRATES;
TITANIUM NITRIDE;
DISPLACEMENT FIELDS;
FOCUSED ION BEAM (FIB) MILLING;
HARD SUBSTRATES;
THIN FILMS;
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EID: 0031637834
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (11)
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