A study of backscattering from multiscale rough surface

Journal of Electromagnetic Waves and Applications

Volumn 12, Issue 7, 1998, Pages 961-979

  Chen, K S ^a   Wu, T D ^a   Fung, A K ^b  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^b The University of Texas at Arlington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC WAVE POLARIZATION; FREQUENCY MODULATION; FUNCTIONS; MATHEMATICAL MODELS; RADAR; SPECTRUM ANALYSIS; SURFACES;

CORRELATION LENGTH; MODULATION CONCEPT; SPECTRAL DECAY RATE; WAVENUMBER;

ELECTROMAGNETIC WAVE BACKSCATTERING;

EID: 0031637088     PISSN: 09205071     EISSN: 15693937     Source Type: Journal    
DOI: 10.1163/156939398X01187     Document Type: Article

References (4)

1. Fung, A. K., Z. Li, and K. S. Chen, "Backscattering from a randomly rough dielectric surface", IEEE Trans. Geosci. Remote Sensing, Vol.30, No.2, 356-369, 1992.
2. Chen, K. S., A. K. Fung, and D. Weissman, "A backscattering model for ocean surface", IEEE Trans. Geosci. Remote Sensing, Vol.30, No.2, 356-369, 1992.
3. Mattia, F., J. C. Souyris, T. Le Toan, D. Casarano, F. Posa, and M. Borgeaud, "On the surface roughness characterization for SAR data analysis", Proceedings of IGARSS 1997, 898-900, Singapore, 1997.
4. Chen, K. S., T. D. Wu, and A. K. Fung, "Modulation effects on surface scattering", PIERS 1997, Cambridge, 1997.