Accuracy of lumped-element calibrations for four-sampler vector network analyzers

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1998, Pages 1487-1490

  Marks, R B ^a   Jargon, J A ^a   Rytting, D K ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC NETWORK ANALYZERS; MEASUREMENT ERRORS;

LUMPED-ELEMENT CALIBRATION; VECTOR NETWORK ANALYZERS (VNA);

ELECTRIC VARIABLES MEASUREMENT;

EID: 0031636095     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)